JPH0747750Y2 - 電子ビームテストシステム - Google Patents
電子ビームテストシステムInfo
- Publication number
- JPH0747750Y2 JPH0747750Y2 JP1988076467U JP7646788U JPH0747750Y2 JP H0747750 Y2 JPH0747750 Y2 JP H0747750Y2 JP 1988076467 U JP1988076467 U JP 1988076467U JP 7646788 U JP7646788 U JP 7646788U JP H0747750 Y2 JPH0747750 Y2 JP H0747750Y2
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- tester
- trigger signal
- supplied
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010894 electron beam technology Methods 0.000 title claims description 23
- 230000001360 synchronised effect Effects 0.000 claims description 10
- 230000003111 delayed effect Effects 0.000 claims description 4
- 230000010355 oscillation Effects 0.000 claims description 3
- 230000001934 delay Effects 0.000 claims 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988076467U JPH0747750Y2 (ja) | 1988-06-08 | 1988-06-08 | 電子ビームテストシステム |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988076467U JPH0747750Y2 (ja) | 1988-06-08 | 1988-06-08 | 電子ビームテストシステム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01179290U JPH01179290U (en]) | 1989-12-22 |
| JPH0747750Y2 true JPH0747750Y2 (ja) | 1995-11-01 |
Family
ID=31301492
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988076467U Expired - Lifetime JPH0747750Y2 (ja) | 1988-06-08 | 1988-06-08 | 電子ビームテストシステム |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0747750Y2 (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2552185Y2 (ja) * | 1990-05-30 | 1997-10-27 | 株式会社アドバンテスト | Ｉｃ試験装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH073775B2 (ja) * | 1986-03-20 | 1995-01-18 | 富士通株式会社 | ストロボ電子ビ−ム装置 |
-
1988
- 1988-06-08 JP JP1988076467U patent/JPH0747750Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01179290U (en]) | 1989-12-22 |
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